Multi-axis knife edge scanning laser beam profiler extended to measurements of M²
M2Beam-Laser Beam Analysis
The M² Beam provides analytical and graphical capability to measure the 2 axis M² figure of merit waist size and location of CW lasers. The M² factor is measured in accordance with the proposed ISO/CD 11 146.
Additionaly, the instrument measures the profile width, position and power of the laser beam at intersection points along the beam propagation axis.
The M² Measurement system is used with a Super BeamAlyzer™ head and a Stand Alone unit.
Measurements
- Beam Propagation (M²)
- Beam Waist Location
- Beam Waist Diameter
- Divergence
- Rayleigh Range
- Waist Asymmetry
- Astigmatism
Specifications
Parameter | Value |
Spectral Range | 400nm to 1100nm for Si version |
800nm to 1800 nm for InGaAs version | |
190nm to 1100nm for UV-Enhanced version | |
Beam Power Range | 100 uW~1W(with supplied internal filters for the Si version) |
100uW~5mW for InGaAs&UV versions | |
Number of Knife-edges | 7 |
Beam size | 15mm diameter with lens(Si&UV versions) |
7mm without lens(Si&UV versions) | |
3mm dia./5mm dia.without lens(InGaAs ver) | |
Maximum Divergence | 10 mrad(no lens) |
Beam Waist to lens Distance | 2.0 to 2.5 meters optimum |
2.0 meters minimum | |
Weight | 2.5kg(without the Super BeamAnlyzer sensor head) |
Dimensions | 100×173×415mm |
Mounting | M6 or 1/4″ screws |
Mechanical adjustment | Horizontal angle:±1.5° Vertical angle:±1.5° |
Cable | 2.5m long |
Ordering Information
Attachment for BeamAnalyzer USB Measurement System:
M2Beam-Si: – attachment for silicon range (350 – 1100nm)
M2Beam-UV: – attachment for silicon range (190 – 1100nm)
M2Beam-IR: – attachment for silicon range (800 – 1800nm)
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