M2 Beam High Power-Beam Profilers

Latest versions of Duma’s M² Laser Beam Propagation Analyzer offers the maximum flexibility and superior capabilities of measurement of pulsed or CW beams, from UV to wavelengths over 1.6 microns.

Two versions are offered:

1) Multi-axis knife edge scanning sensor with folded cavity.

2) Camera based sensor using a similar folded cavity. Specially designed for pulsed lasers or CW beams.

• Beam sizes up to 25 mm
• Wavelengths up to 2.7 microns
• Determination of M², waist location and waist diameter.
• Low & high power laser beams measurement.
• Up to 4 kWatts.
• In accordance with latest relevant ISO standards.

Measurements:

• Beam Propagation (M²)
• Beam Waist Location
• Beam Waist Diameter
• Divergence
• Rayleigh Range
• Waist Asymmetry
• Astigmatism

Specifications

Input Beam

Measuring Method	Knife-edge -7 blades mounted on a rotating drum
Measuring Parameters	Beam size,Power,3-D Reconstruction
Beam Propagation Parameters	BPP over up to 50mm range ,M2 and depth of focus
Optional	ND filters according to application

Scaning Assembly Attachment

Scaning Assembly Attachment
Spectral Range	350nm to 1100nm(Si version)
Beam Power Range	100W~8000W with supplied internal filter(Si version) Continuous Operating Duration-Limited to 10 seconds
Number of Knife-edges	7
Beam size and max.power density at entrance:	Input diameter 8mm
	max Power densitiy at input aperture 0.4kW/mm2
Minimal work distance for focused beams	100mm distance between input aperture to measuring plane of sensor head closest location

Ordering Information

M2Beam-Si – measurement device for silicon range (350 – 1100nm)

M2Beam-UV – measurement device for silicon range (190 – 1100nm)

M2Beam-IR – measurement device for silicon range (800 – 1800nm)

M2Beam-U3-VIS-NIR – measurement device for 350-1600 nm CMOS based

M2Beam-UV-NIR – Special – consult factory.

SAM3-HP-M – beam sampler for high power beams