This is a software driver device that interfaces to any host PC computer, running under Windows Vista/XP/2000/7 (32 & 64 bit), via USB port.
M2 Beam High Power-Beam Profilers
Latest versions of Duma’s M² Laser Beam Propagation Analyzer offers the maximum flexibility and superior capabilities of measurement of pulsed or CW beams, from UV to wavelengths over 1.6 microns.
Two versions are offered:
1) Multi-axis knife edge scanning sensor with folded cavity.
2) Camera based sensor using a similar folded cavity. Specially designed for pulsed lasers or CW beams.
- Beam sizes up to 25 mm
- Wavelengths up to 2.7 microns
- Determination of M², waist location and waist diameter.
- Low & high power laser beams measurement.
- Up to 4 kWatts.
- In accordance with latest relevant ISO standards.
- Beam Propagation (M²)
- Beam Waist Location
- Beam Waist Diameter
- Rayleigh Range
- Waist Asymmetry
|Measuring Method||Knife-edge -7 blades mounted on a rotating drum|
|Measuring Parameters||Beam size,Power,3-D Reconstruction|
|Beam Propagation Parameters||BPP over up to 50mm range ,M2 and depth of focus|
|Optional||ND filters according to application|
Scaning Assembly Attachment
|Scaning Assembly Attachment|
|Spectral Range||350nm to 1100nm(Si version)|
|Beam Power Range||100W~8000W with supplied internal filter(Si version) Continuous Operating Duration-Limited to 10 seconds|
|Number of Knife-edges||7|
|Beam size and max.power density at entrance:||Input diameter 8mm|
|max Power densitiy at input aperture 0.4kW/mm2|
|Minimal work distance for focused beams||100mm distance between input aperture to measuring plane of sensor head closest location|
M2Beam-Si – measurement device for silicon range (350 – 1100nm)
M2Beam-UV – measurement device for silicon range (190 – 1100nm)
M2Beam-IR – measurement device for silicon range (800 – 1800nm)
M2Beam-U3-VIS-NIR – measurement device for 350-1600 nm CMOS based
M2Beam-UV-NIR – Special – consult factory.
SAM3-HP-M – beam sampler for high power beams