Our XUV / VUV spectrograph features aberration-corrected flat-field wavelength coverage from 1nm to 200nm. Wide-band spectral measurements are possible by three gratings covering 1-20nm, 5-80nm, and 40-200nm. The spectrometer can be used without entrance slit to maximize light collection for a range of source distances.
Its modular design is able to match different experimental geometries and configurations. It features an integrated slit holder and filter insertion unit, as well as a motorized grating positioning.
Characteristics:
- Flat-field grazing-incidence spectrograph
- Wavelength ranges: XUV coverage from 5 to 80 nm with a single grating, optional SXR wavelength range 1 to 20 nm. VUV version coverage 40 to 200 nm
- Large selection of geometry options
- Flexible choice of detectors: x-ray CCD-camera or MCP/fiber taper system
- Operating pressure <10-6 mbar Oil-free pump system for stand-alone vacuum operation optionally available
- Customizable according to user requirements
Wavelength [nm] | 1-10 | 3-20 | 5-40 | 10-60 | 25-80 | 40-200 |
Operation mode | slit-less | slit-less | slit-less | slit-less | slit-less | slit-less |
Source distance [m] | flexible | flexible | flexible | flexible | flexible | flexible |
Flat-field size [mm] | 35 | 45 | 21 | 50 | 50 | 100 |
Dispersion [nm/mm] | 0.2 – 0.35 | 0.3 – 0.4 | 0.5 – 0.65 | 0.7 – 1.1 | 0.9 – 1.3 | ≈ 2.0 |
Resolution [nm] | < 0.03 | < 0.035 | < 0.06 | < 0.09 | < 0.11 | < 0.15 |
* Other configurations (spectral range, slit operation, high-resolution, etc) available upon request.
Customization:
- Every spectrometer is customized to exactly match the desired application,e.g.
- Interfacing to experimental chambers
- Adaption of the source distance
- Integration of customer-supplied detectors
- User-defined filter mounts
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